Platform for Characterization & Tes
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ADS：

 Dushu Lake Higher Education Town, Ruoshui Road 398, Suzhou Industrial Park, Suzhou
TEL： 0512-62872554
FAX： 0512-62603079
CODE： 215125
Field Emission TEM  
 
Instruments:
 Field Emission TEM
Model:
 Tecnai G2 F20 S-Twin
Manufacturers:
 FEI, USA
Configuration:
 Electron Mircroscope Basic Unit
 Gatan 894 CCD （2K×2K）
 STEM/HAADF STEM Detector
 EDAX Energy dispersive spectroscope
 Low dose exposure system
 Single-tilt holder, Double-tilt holder, Low-Background double-tilt holder
Specifications:
 Field emission gun assembly with Schottky emitter source
 Voltage: 20, 40, 80, 120, 160, 200kV
 Magnification: 200 x - 100 Mx
 Point resolution: 0.24 nm
 Line resolution: 0.102 nm
 Information resolution: ≤0.14nm
 STEM/HAADF resolution: 0.20 nm
 EDS Resolution: 136eV (B5-U92)
 Maximum eucentric tilt: ±40°
Application: 
    Characterizing the morphology of samples by TEM mode 
    Characterizing the crystal structure image and atomic image of samples by HR-TEM mode
    Obtaining the Electron diffraction pattern
    Obtaining the Z-contrast image of samples by STEM/HAADF
    Element composition analysis on the point, line, plane of samples by combining EDS with STEM
 
Contact us:
Jin-ping Zhang: 0512-62872536; jpzhang2008@sinao.ac.cn
Xiong-hui Zeng: 0512-62872545; xhzeng2007@sinano.ac.cn
 
 
中国科学院苏州纳米技术与纳米仿生研究所（筹） 中国科学院 中华人民共和国科学技术部 中国科学院半导体研究所 中国科学院青年联合会 苏州独墅湖高等教育区
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　                                                ADS： Dushu Lake Higher Education Town, Ruoshui Road 398, Suzhou Industrial Park, Suzhou