(1) Measurement for surface morphology and composition

     - Contact and tapping modes, 0.25nm X-Y resolution and 0.05nm noise

     - Friction imaging and quantitative phase imaging

(2) EFM, MFM and KFM for Local electronic properties of surface

     - Imaging of EFM and MFM

     - KFM measurement for the surface potential，10mV resolution

(3) Carrier Concentration Profiles, oxide layer defects and local electrical conductivity

     - SCM measurement for dC/dV curve to characterize the local Carrier Concentration and oxide layer defects

     - CAFM measurement for I/V curve to characterize the local conductivity of surface.   

     - Current range from 10pA-1mA, bias range from 1mV-12V.

     - SSRM measurement for surface resistance profiles to characterize the local conductivity and carrier concentration.

(4) Organic, biological and electrochemical application

     - Liquid environment
     - Atmosphere environment: N₂/inert gases injection or humidity and pressure controlling

(5) Nanofabrication
     - Control tip motion by programs for nanofabrication and nanolithography

(6) Nano-mechanics

     - Force curve and force spectrum measurement: identifying the Hooke's constant of cantilever by measuring the eigenvalue of

       thermal vibration, force range nN-uN.
     - Quantitative Harmonics module：Harmonics Nanoscale Material Property Mapping enables AFM users to simultaneously, and

        in real-time, acquire high-resolution images as well as high-resolution, quantitative material property maps.

- The diameter of sample should be less than 15mm in general measurement. If measurement need to be in liquid environment,

  please contact us beforehand to acquire a reasonable solution.

- The results of AFM measurement will be effective in comparison with other testing methods, especially SEM.

 

Zheng-hui LIU, Hai-jian ZHONG

Tel: 0512-62872550

E-mail: zhliu2007@sinano.ac.cn; hjzhong2007@sinano.ac.cn