(1) Measurement for surface morphology and composition
- Contact and tapping modes of，0.25nm X-Y resolution and 0.05nm noise
- Friction imaging and quantitative phase imaging
(2) EFM , MFM and KFM for local electronic properties of surface
- Imaging of EFM and MFM
- KFM measurement for the surface potential，10mv resolution
(3) Carrier Concentration Profiles, oxide layer defects and local electrical conductivity
- SCM measurement for dC/dV curve to characterize the local Carrier Concentration and oxide layer defects
- CAFM measurement for I/V curve to characterize the local conductivity of surface;
- Current range from 10pA-1mA，bias range from 1mV-12V.
- SSRM measurement for surface resistance profiles to characterize the local conductivity and carrier concentration.
(4) Nanofabrication
- Control tip motion by programs for nanofabrication and nanolithography
Contact us:
Zheng-hui LIU, Hai-jian ZHONG
Tel: 0512-62872550
E-mail: zhliu2007@sinano.ac.cn; hjzhong2007@sinano.ac.cn |
