Platform for Characterization & Tes

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Kai HUANG Bachelor, Research Assistant

1999.09-2003.07   Automation, HeFei University of Technology
2005.10-2006.09   Laboratory of New Microscope of UAM, Madrid
                              Learn the relative techniques about Atomic Force Microscope.
                              Take part in the research & development of a new High Temperature AFM
 
Tel:0512-62872554

 
中国科学院苏州纳米技术与纳米仿生研究所(筹) 中国科学院 中华人民共和国科学技术部 中国科学院半导体研究所 中国科学院青年联合会 苏州独墅湖高等教育区
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